Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Min, H[Min, Hyegeun] | ko |
dc.contributor.author | Son, JG[Son, Jin Gyeong] | ko |
dc.contributor.author | Kim, JW[Kim, Jeong Won] | ko |
dc.contributor.author | Yu, H[Yu, Hyunung] | ko |
dc.contributor.author | Lee, TG[Lee, Tae Geol] | ko |
dc.contributor.author | Moon, DW[Moon, Dae Won] | ko |
dc.date.available | 2017-07-11T05:26:43Z | - |
dc.date.created | 2017-04-10 | - |
dc.date.issued | 2014-03-20 | - |
dc.identifier.citation | Bulletin of the Korean Chemical Society, v.35, no.3, pp.793 - 797 | - |
dc.identifier.issn | 0253-2964 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11750/2660 | - |
dc.description.abstract | To develop a methodology for absolute determination of the surface areal density of functional groups on organic and bio thin films, medium energy ion scattering (MEIS) spectroscopy was utilized to provide references for calibration of X-ray photoelectron spectroscopy (XPS) or Fourier transformation-infrared (FT-IR) intensities. By using the MEIS, XPS, and FT-IR techniques, we were able to analyze the organic thin film of a Ru dye compound (C58H86O8N8S2Ru), which consists of one Ru atom and various stoichiometric functional groups. From the MEIS analysis, the absolute surface areal density of Ru atoms (or Ru dye molecules) was determined. The surface areal densities of stoichiometric functional groups in the Ru dye compound were used as references for the calibration of XPS and FT-IR intensities for each functional group. The complementary use of MEIS, XPS, and FT-IR to determine the absolute surface areal density of functional groups on organic and bio thin films will be useful for more reliable development of applications based on organic thin films in areas such as flexible displays, solar cells, organic sensors, biomaterials, and biochips. | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.subject | Areal Densities | - |
dc.subject | Bioassay | - |
dc.subject | Biochips | - |
dc.subject | Biological Materials | - |
dc.subject | Calibration | - |
dc.subject | Dye Compound | - |
dc.subject | Dye Molecule | - |
dc.subject | Fourier Transform Infrared Spectroscopy | - |
dc.subject | Fourier Transforms | - |
dc.subject | FT-IR | - |
dc.subject | Functional Group Quantification | - |
dc.subject | Functional Groups | - |
dc.subject | Medium Energy Ion Scattering | - |
dc.subject | MEIS | - |
dc.subject | Organic Sensors | - |
dc.subject | Organic Thin Films | - |
dc.subject | Photoelectrons | - |
dc.subject | Rubidium Compounds | - |
dc.subject | Thin-Films | - |
dc.subject | X Ray Photoelectron Spectroscopy | - |
dc.subject | XPS | - |
dc.title | A Method for Absolute Determination of the Surface Areal Density of Functional Groups in Organic Thin Films | - |
dc.type | Article | - |
dc.identifier.doi | 10.5012/bkcs.2014.35.3.793 | - |
dc.identifier.wosid | 000333500200023 | - |
dc.type.local | Article(Overseas) | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.contributor.nonIdAuthor | Min, H[Min, Hyegeun] | - |
dc.contributor.nonIdAuthor | Son, JG[Son, Jin Gyeong] | - |
dc.contributor.nonIdAuthor | Kim, JW[Kim, Jeong Won] | - |
dc.contributor.nonIdAuthor | Yu, H[Yu, Hyunung] | - |
dc.contributor.nonIdAuthor | Lee, TG[Lee, Tae Geol] | - |
dc.identifier.citationVolume | 35 | - |
dc.identifier.citationNumber | 3 | - |
dc.identifier.citationStartPage | 793 | - |
dc.identifier.citationEndPage | 797 | - |
dc.identifier.citationTitle | Bulletin of the Korean Chemical Society | - |
dc.type.journalArticle | Article | - |
dc.contributor.affiliatedAuthor | Moon, DW[Moon, Dae Won] | - |
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