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Quantitative x-ray magnetic circular dichroism mapping with high spatial resolution full-field magnetic transmission soft x-ray spectro-microscopy
- Quantitative x-ray magnetic circular dichroism mapping with high spatial resolution full-field magnetic transmission soft x-ray spectro-microscopy
- Robertson, MJ[Robertson, MacCallum J.]; Agostino, CJ[Agostino, Christopher J.]; N'Diaye, AT[N'Diaye, Alpha T.]; Chen, G[Chen, Gong]; Im, MY[Im, Mi-Young]; Fischer, P[Fischer, Peter]
- DGIST Authors
- Im, MY[Im, Mi-Young]
- Issue Date
- Journal of Applied Physics, 117(17)
- Article Type
- Characterization Tools; Cobalt; Dichroism; Domain Walls; High Spatial Resolution; Image Resolution; Local Distributions; Magnetic Anisotropy; Magnetic Domains; Magnetic Moments; Magnetic Storage; Magnetic Transmissions; Magnetism; Mapping; Perpendicular Magnetic Anisotropy; Soft X-Ray Microscopy; Spectroscopic Analysis; Spectroscopy; Spin Configurations; Thin-Films; X-Ray Magnetic Circular Dichroism; X Ray Microscopes
- The spectroscopic analysis of X-ray magnetic circular dichroism (XMCD), which serves as strong and element-specific magnetic contrast in full-field magnetic transmission soft x-ray microscopy, is shown to provide information on the local distribution of spin (S) and orbital (L) magnetic moments down to a spatial resolution of 25 nm limited by the x-ray optics used in the x-ray microscope. The spatially resolved L/S ratio observed in a multilayered (Co 0.3 nm/Pt 0.5 nm) × 30 thin film exhibiting a strong perpendicular magnetic anisotropy decreases significantly in the vicinity of domain walls, indicating a non-uniform spin configuration in the vertical profile of a domain wall across the thin film. Quantitative XMCD mapping with x-ray spectro-microscopy will become an important characterization tool for systems with topological or engineered magnetization inhomogeneities. © 2015 AIP Publishing LLC.
- American Institute of Physics Publishing
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