24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011, pp.248 - 250
Type
Conference Paper
ISBN
9781880843833
Abstract
In this paper, a face detection method using a new feature, edge histogram feature, with a support vector machine (SVM) in the near-infrared (NIR) images is proposed. The edge histogram feature is extracted using 16-directional edge intensity and a histogram. Compared to the previous method using local binary pattern (LBP) feature, the proposed method using edge histogram feature has better performance in both smaller feature size and lower equal error rate (EER) for face detection experiments in NIR databases.