Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Dong Hwan | - |
| dc.contributor.author | Kim, Cham | - |
| dc.contributor.author | Kim, Jong Tae | - |
| dc.contributor.author | Yoon, Duck Ki | - |
| dc.contributor.author | Kim, Hoyoung | - |
| dc.date.accessioned | 2023-12-26T20:45:23Z | - |
| dc.date.available | 2023-12-26T20:45:23Z | - |
| dc.date.created | 2018-01-11 | - |
| dc.date.issued | 2017-09-12 | - |
| dc.identifier.issn | 1882-2630 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/47134 | - |
| dc.language | English | - |
| dc.publisher | Thermoelectrics society of japan | - |
| dc.title | Evaluation of interfacial resistances for thermoelectric devices | - |
| dc.type | Conference Paper | - |
| dc.identifier.bibliographicCitation | Annual Meeting of the Thermoelectrics Society of Japan 2017, pp.140 | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.conferencePlace | Osaka | - |
| dc.citation.endPage | 140 | - |
| dc.citation.startPage | 140 | - |
| dc.citation.title | Annual Meeting of the Thermoelectrics Society of Japan 2017 | - |
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- Division of Nanotechnology 2. Conference Papers
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