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Measuring Open Innovation by patents Objectively and Applying it to Analyze IT Convergence Industry
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dc.contributor.author Yun, Jinhyo Joseph -
dc.contributor.author Avvari, Mohan V. -
dc.contributor.author Jung, Wooyoung -
dc.contributor.author Jeong, Eui Seob -
dc.date.accessioned 2023-12-26T21:46:19Z -
dc.date.available 2023-12-26T21:46:19Z -
dc.date.created 2014-12-19 -
dc.date.issued 2012-06-13 -
dc.identifier.isbn 9788896687086 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/47415 -
dc.language English -
dc.publisher Institute of Knowledge Asset Management (IKAM) -
dc.title Measuring Open Innovation by patents Objectively and Applying it to Analyze IT Convergence Industry -
dc.type Conference Paper -
dc.identifier.bibliographicCitation Yun, Jinhyo Joseph. (2012-06-13). Measuring Open Innovation by patents Objectively and Applying it to Analyze IT Convergence Industry. 7th International Forum on Knowledge Asset Dynamics (IFKAD) / 5th Knowledge Cities World Summit (KCWS), 2087–2107. -
dc.identifier.url https://www.ifkad.org/event/ifkad-2012/ -
dc.citation.conferencePlace IT -
dc.citation.conferencePlace Matera -
dc.citation.endPage 2107 -
dc.citation.startPage 2087 -
dc.citation.title 7th International Forum on Knowledge Asset Dynamics (IFKAD) / 5th Knowledge Cities World Summit (KCWS) -
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