Many researchers have proposed various methods to CMOS-based semiconductor devices including spintronics devices using magnetic materials.[1] Several methods exist to characterize the magnetic properties of these devices. Magneto-optical Kerr effect (MOKE) microscopes has the advantage that light passing through a polarizer interacts with the magnetization of a magnetic sample and changes the direction of polarization, allowing the direction of magnetization to be quickly and intuitively seen through an optical image.[2][3] So, MOKE microscopes are widely used to observe domain images, which are determined by the local energy minimization. However, it is inevitable to avoid noise of obtained MOKE image, there are cases where the sample cannot be sufficiently identified.