WEB OF SCIENCE
SCOPUS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeon, Jiwon | - |
| dc.contributor.author | Lee, JaeDong | - |
| dc.date.accessioned | 2024-10-25T22:10:18Z | - |
| dc.date.available | 2024-10-25T22:10:18Z | - |
| dc.date.created | 2024-05-02 | - |
| dc.date.issued | 2024-06 | - |
| dc.identifier.issn | 0368-2048 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/57059 | - |
| dc.description.abstract | Circular dichroism angle-resolved photoemission spectroscopy (CD-ARPES) receives much attention due to a resolving power of topological and quantum geometrical nature of two-dimensional systems. We propose the Lippmann-Schwinger photoelectron final state, a scattering solution of the lattice model comprising screened short-range potentials at periodically arranged atomic sites, which characterizes the time-reversed low energy electron diffraction (LEED) state well enough to describe the final state effect entailed in CD-ARPES. We find that, through the final state effect, the electron screening length identifies CD-ARPES not only in the qualitative dichroic polarity but also in the quantitative dichroic strength in various graphene systems like the monolayer graphene, the AA-stacking bilayer graphene, and the twisted bilayer graphene especially in a unified fashion. This finding reveals an interplay between electron screening and circular dichroism and enables to extend the spectroscopic expertise of CD-ARPES to a direct probe of the electron screening. © 2024 Elsevier B.V. | - |
| dc.language | English | - |
| dc.publisher | Elsevier | - |
| dc.title | Electron screening length identifying circular dichroism of photoemission | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1016/j.elspec.2024.147439 | - |
| dc.identifier.wosid | 001217997300001 | - |
| dc.identifier.scopusid | 2-s2.0-85190882180 | - |
| dc.identifier.bibliographicCitation | Jeon, Jiwon. (2024-06). Electron screening length identifying circular dichroism of photoemission. Journal of Electron Spectroscopy and Related Phenomena, 273. doi: 10.1016/j.elspec.2024.147439 | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.subject.keywordAuthor | Circular dichroism angle -resolved photoemis | - |
| dc.subject.keywordAuthor | sion spectroscopy | - |
| dc.subject.keywordAuthor | Lippmann-Schwinger final state | - |
| dc.subject.keywordAuthor | Final state effect | - |
| dc.subject.keywordAuthor | Electron screening | - |
| dc.subject.keywordAuthor | Graphene materials | - |
| dc.subject.keywordPlus | SURFACE | - |
| dc.subject.keywordPlus | SPECTROSCOPY | - |
| dc.subject.keywordPlus | SYMMETRY | - |
| dc.citation.title | Journal of Electron Spectroscopy and Related Phenomena | - |
| dc.citation.volume | 273 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Spectroscopy | - |
| dc.relation.journalWebOfScienceCategory | Spectroscopy | - |
| dc.type.docType | Article | - |