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Department of Energy Science and Engineering
Energy Materials Design and Processing Lab
1. Journal Articles
Vanishing Soft Electronics: Degradation Mechanisms of Transient Materials
Ho, Dong Hae
;
Cho, Jeong Ho
Department of Energy Science and Engineering
Energy Materials Design and Processing Lab
1. Journal Articles
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Title
Vanishing Soft Electronics: Degradation Mechanisms of Transient Materials
Issued Date
2025-07
Citation
Korean Journal of Chemical Engineering, v.42, no.9, pp.2069 - 2081
Type
Article
Author Keywords
Green electronics
;
Soft electronics
;
Transient electronics
;
Soft materials
Keywords
SILK FIBROIN
;
FILMS
;
BIODEGRADATION
;
TRANSISTORS
;
ULTRATHIN
;
POLYMERS
ISSN
0256-1115
Abstract
The rapid increase in electronic waste, coupled with the emerging demand for soft electronics, necessitates sustainable solutions. Transient soft electronics, designed to degrade after use, offer a promising pathway to address this issue. This review explores transient soft electronics from a degradation mechanism of transient dielectrics materials perspective, focusing on three primary degradation mechanisms: water-driven, organic solvent-driven, and bio-driven. The degradation processes for each mechanism will be discussed, and representative research in each area will be showcased. Additionally, the review will highlight the challenges associated with transient soft electronics in each category. © The Author(s), under exclusive licence to Korean Institute of Chemical Engineers, Seoul, Korea 2024.
URI
http://hdl.handle.net/20.500.11750/57443
DOI
10.1007/s11814-024-00320-0
Publisher
Springer Nature
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Ho, Dong Hae
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