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REFLECTED OPTICAL WAVELENGTH SCANNING DEVICE PROVIDED WITH SILICON PHOTONIC INTERROGATOR
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dc.contributor.author 문형명 -
dc.contributor.author 한상윤 -
dc.date.accessioned 2025-11-18T14:40:14Z -
dc.date.available 2025-11-18T14:40:14Z -
dc.identifier.uri https://scholar.dgist.ac.kr/handle/20.500.11750/59188 -
dc.description.abstract The present invention provides a reflected optical wavelength scanning device provided with a silicon photonic interrogator. The device may comprise: a light source module which outputs broadband light; an optical sensor which receives, through a circulator, the light outputted from the light source module, reflects light of a specific band to the circulator, and transmits light of the other bands other than the specific band; and an interrogator which separates polarized light from the reflected light received through the circulator, and enables the selective incidence of the polarized light. -
dc.title REFLECTED OPTICAL WAVELENGTH SCANNING DEVICE PROVIDED WITH SILICON PHOTONIC INTERROGATOR -
dc.title.alternative REFLECTED LIGHT WAVELENGTH SCANNING DEVICE INCLUDING SILICON PHOTONICS INTERROGATOR -
dc.type Patent -
dc.publisher.country UN -
dc.identifier.patentApplicationNumber PCT/KR2021/017451 -
dc.date.application 2021-11-25 -
dc.identifier.patentRegistrationNumber 2022181935 -
dc.date.registration 2022-09-01 -
dc.contributor.assignee PHOTONICS PLANAR INTEGRATION TECHNOLOGY INC,주식회사 피피아이,DAEGU GYEONGBUK INSTITUTE OF SCIENCE AND TECHNOLOGY,재단법인대구경북과학기술원 -
dc.type.iprs 특허 -
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한상윤
Han, Sangyoon한상윤

Department of Robotics and Mechatronics Engineering

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