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Probing of Single-Interface Dzyaloshinskii-Moriya Interaction

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dc.contributor.author Yu, Ji-Sung -
dc.contributor.author Lee, Seong-Hyub -
dc.contributor.author Kim, Minhwan -
dc.contributor.author Kim, Dae-Yun -
dc.contributor.author Han, Gunn-Hee -
dc.contributor.author Shim, Wooyoung -
dc.contributor.author Shin, Jiho -
dc.contributor.author Mok, Yohan -
dc.contributor.author Cho, Jaehun -
dc.contributor.author Kim, Duck-Ho -
dc.contributor.author Choe, Sug-Bong -
dc.date.accessioned 2026-10-26T11:10:12Z -
dc.date.available 2026-10-26T11:10:12Z -
dc.date.created 2026-08-28 -
dc.date.issued 2026-09 -
dc.identifier.issn 2199-160X -
dc.identifier.uri https://scholar.dgist.ac.kr/handle/20.500.11750/61025 -
dc.description.abstract The interfacial Dzyaloshinskii-Moriya interaction (DMI) is a fundamental antisymmetric exchange interaction that favors nonlinear spin orders and emerges prominently at interfaces in ultrathin magnetic films. The lack of single-interface resolution obscures both the magnitude and sign of the DMI at the interface of interest, and remains a challenge. Herein, we report the probing of a Pt/Co single-interface DMI under isolated interface conditions. Uncapped Co films on Pt were investigated in a vacuum using a magneto-optical Kerr microscope to observe the magnetic domains. The single-interface DMI is clearly revealed by the asymmetric domain-wall speed measurements. By resolving the Pt/Co single-interface DMI with systematic thickness control at a subatomic level, we confirm that subtle changes can be captured at the interface. This method offers a powerful tool for probing diverse interface-specific properties and is expected to advance the understanding of interface-driven physics with broad implications for chiral spin-orbitronics. -
dc.language English -
dc.publisher WILEY-V C H VERLAG GMBH -
dc.title Probing of Single-Interface Dzyaloshinskii-Moriya Interaction -
dc.type Article -
dc.identifier.doi 10.1002/aelm.70537 -
dc.identifier.wosid 001850796600001 -
dc.identifier.scopusid 2-s2.0-105047605131 -
dc.identifier.bibliographicCitation ADVANCED ELECTRONIC MATERIALS, v.12, no.17 -
dc.description.isOpenAccess TRUE -
dc.subject.keywordAuthor condensed matter physics -
dc.subject.keywordAuthor domain wall (magnetism) -
dc.subject.keywordAuthor domain wall dynamics -
dc.subject.keywordAuthor spintronics -
dc.subject.keywordAuthor kerr effect -
dc.subject.keywordAuthor microscope -
dc.subject.keywordAuthor spin–orbit interaction -
dc.subject.keywordAuthor exchange interaction -
dc.subject.keywordPlus SURFACES -
dc.citation.number 17 -
dc.citation.title ADVANCED ELECTRONIC MATERIALS -
dc.citation.volume 12 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science; Physics -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied -
dc.type.docType Article -
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