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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Dong Hwan | ko |
| dc.contributor.author | Kim, Cham | ko |
| dc.contributor.author | Kim, Jong Tae | ko |
| dc.contributor.author | Baek, Ju Young | ko |
| dc.contributor.author | Kim, Ho Young | ko |
| dc.date.accessioned | 2018-06-01T03:58:33Z | - |
| dc.date.available | 2018-06-01T03:58:33Z | - |
| dc.date.created | 2018-03-29 | - |
| dc.date.issued | 2016 | - |
| dc.identifier.citation | 2016 Thermoelectric Society of Japan (TSJ2016), pp.122 - 122 | - |
| dc.identifier.issn | 1882-2630 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/6479 | - |
| dc.language | English | - |
| dc.publisher | Thermoelectric Society of Japan | - |
| dc.title | The interfacial resistances of thermoelectric device from the I-V measurement | - |
| dc.type | Article | - |
| dc.type.local | Article(Overseas) | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | Kim, Dong Hwan. (2016). The interfacial resistances of thermoelectric device from the I-V measurement. | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.citationStartPage | 122 | - |
| dc.identifier.citationEndPage | 122 | - |
| dc.identifier.citationTitle | 2016 Thermoelectric Society of Japan (TSJ2016) | - |
| dc.description.isOpenAccess | N | - |
| dc.contributor.affiliatedAuthor | Kim, Dong Hwan | - |
| dc.contributor.affiliatedAuthor | Kim, Cham | - |
| dc.contributor.affiliatedAuthor | Kim, Ho Young | - |
