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dc.contributor.author Im, Mi‐Young -
dc.date.accessioned 2018-10-30T05:59:30Z -
dc.date.available 2018-10-30T05:59:30Z -
dc.date.created 2018-10-22 -
dc.date.issued 2018-11 -
dc.identifier.citation Current Applied Physics, v.18, no.11, pp.1174 - 1181 -
dc.identifier.issn 1567-1739 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/9373 -
dc.description.abstract In nanomagnetism, one of the crucial scientific questions is whether magnetic behaviors are deterministic or stochastic on a nanoscale. Apart from the exciting physical issue, this question is also of paramount highest relevance for using magnetic materials in a wealth of technological applications such as magnetic storage and sensor devices. In the past, the research on the stochasticity of a magnetic process has been mainly done by macroscopic measurements, which only offer ensemble-averaged information. To give more accurate answer for the question and to fully understand related underlying physics, the direct observation of statistical behaviors in magnetic structures and magnetic phenomena utilizing advanced characterization techniques is highly required. One of the ideal tools for such study is a full-field soft X-ray microscope since it enables imaging of magnetic structures on the large field of view within a few seconds. Here we review the stochastic behaviors of various magnetic processes including magnetization reversal process in thin films, magnetic domain wall motions in nanowires, and magnetic vortex formations in nanodisks studied by full-field soft X-ray microscopy. The origin triggering the stochastic nature witnessed in each magnetic process and the way to control the intrinsic nature are also discussed. © 2018 Korean Physical Society -
dc.language English -
dc.publisher 한국물리학회 -
dc.title Stochastic nature of magnetic processes studied by full-field soft X-ray microscopy -
dc.type Article -
dc.identifier.doi 10.1016/j.cap.2018.05.004 -
dc.identifier.wosid 000446676900002 -
dc.identifier.scopusid 2-s2.0-85047180334 -
dc.type.local Article(Overseas) -
dc.type.rims ART -
dc.description.journalClass 1 -
dc.citation.publicationname Current Applied Physics -
dc.identifier.kciid ART002406055 -
dc.contributor.nonIdAuthor Im, Mi‐Young -
dc.identifier.citationVolume 18 -
dc.identifier.citationNumber 11 -
dc.identifier.citationStartPage 1174 -
dc.identifier.citationEndPage 1181 -
dc.identifier.citationTitle Current Applied Physics -
dc.type.journalArticle Review -
dc.description.isOpenAccess Y -
dc.subject.keywordAuthor Magnetic reversal -
dc.subject.keywordAuthor Magnetic domain wall -
dc.subject.keywordAuthor Magnetic vortices -
dc.subject.keywordAuthor Soft x-ray microscopy -
dc.subject.keywordAuthor Nanomaterials -
dc.subject.keywordPlus DOMAIN-WALL -
dc.subject.keywordPlus SHIFT REGISTER -
dc.subject.keywordPlus THIN-FILMS -
dc.subject.keywordPlus RESOLUTION -
dc.subject.keywordPlus DYNAMICS -
dc.subject.keywordPlus BEHAVIOR -
dc.subject.keywordPlus FUTURE -
dc.contributor.affiliatedAuthor Im, Mi‐Young -
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