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Bi-Layered Reram: Multi-Level Switching, Reliability and its Mechanism for Storage Class Memory and Reconfiguration Logic
  • Chung, U-In ; 
  • Kim, Young-Bae ; 
  • Lee, Seung Ryul ; 
  • Lee, Dongsoo ; 
  • Lee, Chang Bum ; 
  • Chang, Man ; 
  • Kim, Kyung min ; 
  • Hur, Ji Hyun ; 
  • Lee, Myoung-Jae ; 
  • Kim, Chang Jung
  • 2012-06
  • Chung, U-In. (2012-06). Bi-Layered Reram: Multi-Level Switching, Reliability and its Mechanism for Storage Class Memory and Reconfiguration Logic. doi: 10.1002/9783527667703.ch19
  • Wiley-VCH Verlag GmbH & Co. KGaA
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