Title

Bi-Layered Reram: Multi-Level Switching, Reliability and its Mechanism for Storage Class Memory and Reconfiguration Logic

DGIST Authors

Chung, U-In ; Kim, Young-Bae ; Lee, Seung Ryul ; Lee, Dongsoo ; Lee, Chang Bum ; Chang, Man ; Kim, Kyung min ; Hur, Ji Hyun ; Lee, Myoung-Jae ; Kim, Chang Jung

Issued Date

2012-06

Citation

Chung, U-In. (2012-06). Bi-Layered Reram: Multi-Level Switching, Reliability and its Mechanism for Storage Class Memory and Reconfiguration Logic. doi: 10.1002/9783527667703.ch19

Type

Article

URI

http://hdl.handle.net/20.500.11750/13397

DOI

10.1002/9783527667703.ch19

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Show Full Item Record