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Showing results 1 to 2 of 2

Conference
CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation
  • Crafton, Brian ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Wu, Wei ; 
  • Tokunaga, Carlos ; 
  • De, Vivek ; 
  • Raychowdhury, Arijit
  • 2021-11-09
  • Crafton, Brian. (2021-11-09). CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation. IEEE Asian Solid-State Circuits Conference, 1–3. doi: 10.1109/A-SSCC53895.2021.9634742
  • IEEE Solid-State Circuits Society
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Conference
Improving compute in-memory ECC reliability with successive correction
  • Crafton, Brian ; 
  • Wan, Zishen ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Wu, Wei ; 
  • Tokunaga,Carlos ; 
  • De, Vivek ; 
  • Raychowdhury, Arijit
  • 2022-07-13
  • Crafton, Brian. (2022-07-13). Improving compute in-memory ECC reliability with successive correction. Design Automation Conference, 745–750. doi: 10.1145/3489517.3530526
  • Association for Computing Machinery
  • View : 133
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