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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article
Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy
  • Jung, Kang-Won ; 
  • Yu, Hyunung ; 
  • Min, Won Ja ; 
  • Yu, Kyu-Sang ; 
  • Sortica, M. A. ; 
  • Grande, Pedro L. ; 
  • Moon, DaeWon
  • 2014-01-21
  • Jung, Kang-Won. (2014-01-21). Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy. Analytical Chemistry, 86(2), 1091–1097. doi: 10.1021/ac402753j
  • American Chemical Society
  • View : 936
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Article
Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO 2 /SiO 2 /Si films
  • Min, Won Ja ; 
  • Marmitt, Gabriel ; 
  • Grande, Pedro L. ; 
  • Moon, DaeWon
  • 2019-07
  • Min, Won Ja. (2019-07). Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO 2 /SiO 2 /Si films. doi: 10.1002/sia.6642
  • John Wiley & Sons Inc.
  • View : 636
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