Showing results 1 to 7 of 7
- 2024-11
- Lim, Jeong-A. (2024-11). Cutting-Edge Inference: Dynamic DNN Model Partitioning and Resource Scaling for Mobile AI. IEEE Transactions on Services Computing, 17(6), 3300–3316. doi: 10.1109/TSC.2024.3466848
- Institute of Electrical and Electronics Engineers
- View : 109
- Download : 0
- 2023-01
- Kim, Yeongjin. (2023-01). Dynamic Computation and Network Chaining in Integrated SDN/NFV Cloud Infrastructure. IEEE Transactions on Cloud Computing, 11(1), 367–382. doi: 10.1109/TCC.2021.3094681
- Institute of Electrical and Electronics Engineers Inc.
- View : 636
- Download : 0
- 2023-09-13
- Ham, Dongho. (2023-09-13). Dynamic Interplay Between Service Caching and Code Offloading in Mobile-Edge-Cloud Networks. IEEE International Conference on Sensing, Communication, and Networking, 339–347. doi: 10.1109/SECON58729.2023.10287464
- IEEE Computer Society
- View : 68
- Download : 0
- 2023-03
- Lee, Kyungtae. (2023-03). Dynamic Multi-Resource Optimization for Storage Acceleration in Cloud Storage Systems. IEEE Transactions on Services Computing, 16(2), 1079–1092. doi: 10.1109/TSC.2022.3173333
- Institute of Electrical and Electronics Engineers
- View : 449
- Download : 0
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Kim, Yeongjin
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Jeong, Jaehwan
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Ahn, Suyoung
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Kwak, Jeongho
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Chong, Song
- 2022-04
- Kim, Yeongjin. (2022-04). Energy and Delay Guaranteed Joint Beam and User Scheduling Policy in 5G CoMP Networks. IEEE Transactions on Wireless Communications, 21(4), 2742–2756. doi: 10.1109/TWC.2021.3115162
- Institute of Electrical and Electronics Engineers
- View : 624
- Download : 0
- 2023-10
- Kim, Yeongjin. (2023-10). Network-Compute Co-Optimization for Service Chaining in Cloud-Edge-Radio 5G Networks. IEEE Transactions on Vehicular Technology, 72(10), 13374–13391. doi: 10.1109/TVT.2023.3271693
- Institute of Electrical and Electronics Engineers Inc.
- View : 347
- Download : 0
- 2024-05
- Choi, Pyeongjun. (2024-05). VisionScaling: Dynamic Deep Learning Model and Resource Scaling in Mobile Vision Applications. IEEE Internet of Things Journal, 11(9), 15523–15539. doi: 10.1109/JIOT.2024.3349512
- Institute of Electrical and Electronics Engineers Inc.
- View : 202
- Download : 0
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