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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 2 of 2

Article
Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors
  • Choi, Yubin ; 
  • Yang, Hyojin ; 
  • Kim, Hwan Jin ; 
  • Park, Sejun ; 
  • Lee, Yoon Jung ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Kim, Dong Myong ; 
  • Kim, Haesung ; 
  • Bae, Jong-Ho
  • 2026-06
  • APPLIED PHYSICS LETTERS, v.128, no.24
  • AIP Publishing
  • View : 12
  • Download : 0

Quantitative Analysis on the Interaction Between Channel Carrier and Remote Trap in HfxZr1-xO2/SiO2 Interface in Ferroelectric Field-Effect-Transistor

Article
Quantitative Analysis on the Interaction Between Channel Carrier and Remote Trap in HfxZr1-xO2/SiO2 Interface in Ferroelectric Field-Effect-Transistor
  • Lee, Haneul ; 
  • Kim, Sujong ; 
  • Han, Changhyeon ; 
  • Kim, Haesung ; 
  • Yang, Hyojin ; 
  • Park, Sejun ; 
  • Yun, Sanghyuk ; 
  • Lee, Yoon Jung ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
    • et al
  • 2026-01
  • ADVANCED ELECTRONIC MATERIALS, v.12, no.2
  • WILEY
  • View : 45
  • Download : 37
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