DGIST Library Repository

Browsing by Titles

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 1 of 1

Conference
CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation
  • Crafton, Brian ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Wu, Wei ; 
  • Tokunaga, Carlos ; 
  • De, Vivek ; 
  • Raychowdhury, Arijit
  • 2021-11-09
  • Crafton, Brian. (2021-11-09). CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation. IEEE Asian Solid-State Circuits Conference, 1–3. doi: 10.1109/A-SSCC53895.2021.9634742
  • IEEE Solid-State Circuits Society
  • View : 77
  • Download : 0
1