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Issue Date	Title Author(s) Journal	View
2022-05-30	Characterization and Mitigation of IR-Drop in RRAM-based Compute In-Memory Crafton, Brian ; Talley, Connor ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Raychowdhury, Arijit IEEE International Symposium on Circuits and Systems (ISCAS 2022), pp.70 - 74, 2022-05-30	39

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