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Article
Defect-mediated enhancement of memory window in IGZO-channel ferroelectric field effect transistors
  • Yang, Hyojin ; 
  • Kim, Haesung ; 
  • Kim, Hwan Jin ; 
  • Kim, Dong Myong ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Lee, Yoon Jung ; 
  • Bae, Jong-Ho
  • 2026-03
  • Materials Science in Semiconductor Processing, v.204
  • Elsevier
  • View : 31
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Article
Photonic I-V Technique With Photogating Effect for Extended Extraction of Subgap Density of States in Amorphous Oxide Semiconductor TFTs
  • Kim, Haesung ; 
  • Han, Seung Hyeop ; 
  • Jeong, Hyunwook ; 
  • Yang, Hyojin ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Bae, Jong-Ho ; 
  • Kim, Dong Myong
  • 2025-05
  • Kim, Haesung. (2025-05). Photonic I-V Technique With Photogating Effect for Extended Extraction of Subgap Density of States in Amorphous Oxide Semiconductor TFTs. IEEE Transactions on Electron Devices, 72(5), 2751–2755. doi: 10.1109/TED.2025.3547707
  • Institute of Electrical and Electronics Engineers
  • View : 99
  • Download : 0
Conference
Quantitative Analysis of Endurance-dependent Charge Trapping Dynamics in Ferroelectric Field-Effect Transistors with Temperature Effects
  • Yang, Hyojin ; 
  • Kim, Haesung ; 
  • Han, Changhyeon ; 
  • Lee, Yoon Jung ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Kim, Dong Myong ; 
  • Kwon, Daewoong ; 
  • Bae, Jong-Ho
  • 2025-06-08
  • 2025 Silicon Nanoelectronics Workshop, SNW 2025, pp.74 - 75
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 25
  • Download : 0
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