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Showing results 1 to 5 of 5

Issue Date	Title Author(s) Journal	View
2017	Evaluation of interfacial resistances for thermoelectric devices Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Ho Young Thermoelectric Society of Japan, 2017	645
2017-09-12	Evaluation of interfacial resistances for thermoelectric devices Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Hoyoung Annual Meeting of the Thermoelectrics Society of Japan 2017, pp.140, 2017-09-12	26
2016	High thermoelectric figure of merit in n-typeBi-Te alloys at low temperatures Kim, Dong Hwan ; Baek, Ju Young ; Hwang, In Ji ; Kim, Cham ; Yoon, Duck Ki ; Kim, Ho Young Thermoelectric Society of Japan, 2016	617
2018-12	Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Hoyoung Elsevier B.V., 2018-12	728
2022-03	Synergistic Optimization of the Thermoelectric and Mechanical Properties of Large-Size Homogeneous Bi0.5Sb1.5Te3Bulk Samples via Carrier Engineering for Efficient Energy Harvesting Lee, Chul-hee ; Dharmaiah, Peyala ; Kim, Dong Hwan ; Yoon, Duck Ki ; Kim, Tae Hoon ; Song, Sung Ho ; Hong, Soon-Jik ACS Applied Materials & Interfaces, v.14, no.8, pp.10394 - 10406, 2022-03	238

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