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Article
Electrical and optical properties of Ti doped ZnO films grown on glass substrate by atomic layer deposition
  • Wan, Zhixin ; 
  • Kwack, Won-Sub ; 
  • Lee, Woo-Jae ; 
  • Jang, Seung-II ; 
  • Kim, Hye-Ri ; 
  • Kim, Jin-Woong ; 
  • Jung, Kang-Won ; 
  • Min, Won-Ja ; 
  • Yu, Kyu-Sang ; 
  • Park, Sung-Hun ; 
    • et al
  • 2014-09
  • Wan, Zhixin. (2014-09). Electrical and optical properties of Ti doped ZnO films grown on glass substrate by atomic layer deposition. Materials Research Bulletin, 57, 23–28. doi: 10.1016/j.materresbull.2014.04.070
  • Elsevier Ltd
  • View : 1011
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Article
Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy
  • Min, Won Ja ; 
  • Park, Kyungsu ; 
  • Yu, Kyu-Sang ; 
  • Joo, Sungjung ; 
  • Kim, Yong-Sung ; 
  • Moon, Dae Won
  • 2015-10-07
  • Min, Won Ja. (2015-10-07). Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy. Journal of Applied Physics, 118(13). doi: 10.1063/1.4932149
  • American Institute of Physics Publishing
  • View : 965
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Article
Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy
  • Jung, Kang-Won ; 
  • Yu, Hyunung ; 
  • Min, Won Ja ; 
  • Yu, Kyu-Sang ; 
  • Sortica, M. A. ; 
  • Grande, Pedro L. ; 
  • Moon, DaeWon
  • 2014-01-21
  • Jung, Kang-Won. (2014-01-21). Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy. Analytical Chemistry, 86(2), 1091–1097. doi: 10.1021/ac402753j
  • American Chemical Society
  • View : 875
  • Download : 0
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