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Article
Characteristics of Al-Doped ZnO Films Grown by Atomic Layer Deposition for Silicon Nanowire Photovoltaic Device
  • Oh, BY[Oh, Byeong-Yun] ; 
  • Han, JW[Han, Jin-Woo] ; 
  • Seo, DS[Seo, Dae-Shik] ; 
  • Kim, KY[Kim, Kwang-Young] ; 
  • Baek, SH[Baek, Seong-Ho] ; 
  • Jang, HS[Jang, Hwan Soo] ; 
  • Kim, JH[Kim, Jae Hyun]
  • 2012-07
  • Oh, BY[Oh, Byeong-Yun]. (2012-07). Characteristics of Al-Doped ZnO Films Grown by Atomic Layer Deposition for Silicon Nanowire Photovoltaic Device. doi: 10.1166/jnn.2012.6255
  • American Scientific Publishers
  • View : 938
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Article
Dimensional crossover of charge density wave and thermoelectric properties in CeTe2-xSbx single crystals
  • Lee, KE[Lee, Kyung Eun] ; 
  • Min, BH[Min, Byeong Hun] ; 
  • Rhyee, JS[Rhyee, Jong-Soo] ; 
  • Kim, JN[Kim, Jae Nyeong] ; 
  • Shim, JH[Shim, Ji Hoon] ; 
  • Kwon, YS[Kwon, Yong Seung]
  • 2012-10-01
  • Lee, KE[Lee, Kyung Eun]. (2012-10-01). Dimensional crossover of charge density wave and thermoelectric properties in CeTe2-xSbx single crystals. doi: 10.1063/1.4756911
  • American Institute of Physics Publishing
  • View : 780
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Article
Eliminating the undercut phenomenon in interference lithography for the fabrication of nano-imprint lithography stamp
  • Jang, Hwan Soo ; 
  • Kim, Gee Hong ; 
  • Lee, Jaejong ; 
  • Choi, Kee Bong
  • 2010-11
  • Jang, Hwan Soo. (2010-11). Eliminating the undercut phenomenon in interference lithography for the fabrication of nano-imprint lithography stamp. Current Applied Physics, 10(6), 1436–1441. doi: 10.1016/j.cap.2010.05.009
  • Elsevier B.V.
  • View : 869
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Article
Eliminating the undercut phenomenon in interference lithography for the fabrication of nano-imprint lithography stamp
  • Jang, Hwan Soo ; 
  • Kim, Gee Hong ; 
  • Lee, Jaejong ; 
  • Choi, Kee Bong
  • 2010-11
  • Jang, Hwan Soo. (2010-11). Eliminating the undercut phenomenon in interference lithography for the fabrication of nano-imprint lithography stamp. Current Applied Physics, 10(6), 1436–1441. doi: 10.1016/j.cap.2010.05.009
  • Elsevier B.V.
  • View : 995
  • Download : 0
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