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Yoon, Jong-Hyeok
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Chang, Muya
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Khwa, Win-San
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Chih, Yu-Der
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Chang, Meng-Fan
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Raychowdhury, Arijit
- 2022-03
- Yoon, Jong-Hyeok. (2022-03). A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding. IEEE Journal of Solid-State Circuits, 57(3), 845–857. doi: 10.1109/JSSC.2022.3141370
- Institute of Electrical and Electronics Engineers
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