Showing results 1 to 7 of 7
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Noh, Seock-Hwan
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Lee, Seungpyo
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Shin, Banseok
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Park, Sehun
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Jang, Yongjoo
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Kung, Jaeha
- 2025-05
- Noh, Seock-Hwan. (2025-05). All-Rounder: A Flexible AI Accelerator With Diverse Data Format Support and Morphable Structure for Multi-DNN Processing. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 33(5), 1264–1277. doi: 10.1109/TVLSI.2025.3540346
- Institute of Electrical and Electronics Engineers
- View : 44
- Download : 0
- 2021-01
- Jang, Yongjoo. (2021-01). Deep Partitioned Training from Near-Storage Computing to DNN Accelerators. doi: 10.1109/LCA.2021.3081752
- Institute of Electrical and Electronics Engineers
- View : 624
- Download : 0
- 2021-06
- Kim, Youngwook. (2021-06). Human Activity Classification Based on Point Clouds Measured by Millimeter Wave MIMO Radar with Deep Recurrent Neural Networks. IEEE Sensors Journal, 21(12), 13522–13529. doi: 10.1109/JSEN.2021.3068388
- Institute of Electrical and Electronics Engineers
- View : 721
- Download : 0
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Lee, Hyeon Gyu
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Kim, Minwook
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Lee, Juwon
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Lee, Eunji
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Kim, Bryan S.
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Lee, Sungjin
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Kim, Yeseong
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Min, Sang Lyul
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Kim, Jin-Soo
- 2021-07
- Lee, Hyeon Gyu. (2021-07). Learned Performance Model for SSD. IEEE Computer Architecture Letters, 20(2), 154–157. doi: 10.1109/LCA.2021.3120728
- Institute of Electrical and Electronics Engineers
- View : 638
- Download : 0
- 2019-06
- Khanna, Rohan. (2019-06). Through-Wall Remote Human Voice Recognition Using Doppler Radar With Transfer Learning. doi: 10.1109/JSEN.2019.2901271
- Institute of Electrical and Electronics Engineers
- View : 923
- Download : 0
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Kim, Jinwook
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Yoon, Heeyong
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Kim, Min-Soo
- 2022-09
- Kim, Jinwook. (2022-09). Tweaking Deep Neural Networks. IEEE Transactions on Pattern Analysis and Machine Intelligence, 44(9), 1–1. doi: 10.1109/TPAMI.2021.3079511
- IEEE Computer Society
- View : 417
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Koo, Gyogwon
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Yun, Jong Pil
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Choi, Hyeyeon
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Kim, Sang Woo
- 2021-04
- Koo, Gyogwon. (2021-04). Unified deep neural networks for end-to-end recognition of multi-oriented billet identification number. Expert Systems with Applications, 168, 114377. doi: 10.1016/j.eswa.2020.114377
- Pergamon Press Ltd.
- View : 1012
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