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Department of Electrical Engineering and Computer Science
Data-Intensive Computing Systems Laboratory
1. Journal Articles
Learned Performance Model for SSD
Lee, Hyeon Gyu
;
Kim, Minwook
;
Lee, Juwon
;
Lee, Eunji
;
Kim, Bryan S.
;
Lee, Sungjin
;
Kim, Yeseong
;
Min, Sang Lyul
;
Kim, Jin-Soo
Department of Electrical Engineering and Computer Science
Computation Efficient Learning Lab.
1. Journal Articles
Department of Electrical Engineering and Computer Science
Data-Intensive Computing Systems Laboratory
1. Journal Articles
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Title
Learned Performance Model for SSD
Issued Date
2021-07
Citation
Lee, Hyeon Gyu. (2021-07). Learned Performance Model for SSD. IEEE Computer Architecture Letters, 20(2), 154–157. doi: 10.1109/LCA.2021.3120728
Type
Article
Author Keywords
Cross-platform
;
performance prediction
;
solid state drives
;
simulation
Keywords
Simulators
;
Deep neural networks
;
Digital storage
;
Firmware
;
Linear regression
;
Cross-platform
;
Hardware
;
Performance
;
Performance Modeling
;
Performance prediction
;
Performances evaluation
;
Predictive models
;
Prototype
;
Simulation
;
Solid state drive
ISSN
1556-6056
Abstract
The advent of new SSDs with ultra-low latency makes the validation of their firmware critical in the development process. However, existing SSD simulators do not sufficiently achieve high accuracy in their performance estimations for their firmware. In this paper, we present an accurate and data-driven performance model that builds a cross-platform relationship between the simulator and target platform. We directly execute the firmware on both platforms, collect its related performance profiles, and construct a performance model that infers the firmware's performance on the target platform using performance events from the simulation. We explore both a linear regression model and a deep neural network model, and our cross-validation shows that our model achieves a percent error of 3.1%, significantly lower than 18.9% from a state-of-the-art simulator. © 2021 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
URI
http://hdl.handle.net/20.500.11750/15856
DOI
10.1109/LCA.2021.3120728
Publisher
Institute of Electrical and Electronics Engineers
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Lee, Sungjin
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