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Issue Date	Title Author(s) Journal	View
2012-03	Debye Length and Active Layer Thickness-Dependent Performance Variations of Amorphous Oxide-Based TFTs Jeong, J[Jeong, Jaewook] ; Hong, Y[Hong, Yongtaek] Institute of Electrical and Electronics Engineers Inc., 2012-03	681
2011-11-10	Numerical analysis of effects of back channel interfacial states on characteristics of amorphous InGaZnO thin-film transistors Jeong, J. ; Kim, J. ; Lee, G. J. ; Choi, B. -D. Electronics Letters, v.47, no.23, pp.1295 - 1297, 2011-11-10	635
2011-11-10	Numerical analysis of effects of back channel interfacial states on characteristics of amorphous InGaZnO thin-film transistors Jeong, J. ; Kim, J. ; Lee, G. J. ; Choi, B. -D. Electronics Letters, v.47, no.23, pp.1295 - 1297, 2011-11-10	27

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