Showing results 1 to 3 of 3
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Eom, Tae-Kwang
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Sari, Windu
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Cheon, Taehoon
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Kim, Soo-Hyun
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Kim, Woo Kyoung
- 2012-10
- Eom, Tae-Kwang. (2012-10). A bilayer diffusion barrier of Ru/WSixNy for advanced Cu interconnects. doi: 10.1016/j.tsf.2012.03.068
- Elsevier BV
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Nam, Taewook
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Lee, Chang Wan
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Cheon, Taehoon
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Lee, Woo Jae
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Kim, Soo-Hyun
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Kwon, Se-Hun
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Lee, Han-Bo-Ram
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Kim, Hyungjun
- 2018-03
- Nam, Taewook. (2018-03). Cobalt titanium nitride amorphous metal alloys by atomic layer deposition. Journal of Alloys and Compounds, 737, 684–692. doi: 10.1016/j.jallcom.2017.12.023
- Elsevier BV
- View : 533
- Download : 0
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Mun, Ki-Yeung
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Hong, Tae Eun
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Cheon, Taehoon
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Jang, Yujin
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Lim, Byoung-Yong
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Kim, Sunjung
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Kim, Soo-Hyun
- 2014-07-01
- Mun, Ki-Yeung. (2014-07-01). The effects of nitrogen incorporation on the properties of atomic layer deposited Ru thin films as a direct-plateable diffusion barrier for Cu interconnect. Thin Solid Films, 562, 118–125. doi: 10.1016/j.tsf.2014.03.088
- Elsevier
- View : 710
- Download : 0
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