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Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires
  • Fukata, N[Fukata, Naoki] ; 
  • Mitome, M[Mitome, Masanori] ; 
  • Sekiguchi, T[Sekiguchi, Takashi] ; 
  • Bando, Y[Bando, Yoshio] ; 
  • Kirkham, M[Kirkham, Melanie] ; 
  • Hong, JI[Hong, Jung-Il] ; 
  • Wang, ZL[Wang, Zhong Lin] ; 
  • Snydert, RL[Snydert, Robert L.]
  • 2012-10
  • Fukata, N[Fukata, Naoki]. (2012-10). Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires. doi: 10.1021/nn302881w
  • American Chemical Society
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