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Article
A Method for Absolute Determination of the Surface Areal Density of Functional Groups in Organic Thin Films
  • Min, H[Min, Hyegeun] ; 
  • Son, JG[Son, Jin Gyeong] ; 
  • Kim, JW[Kim, Jeong Won] ; 
  • Yu, H[Yu, Hyunung] ; 
  • Lee, TG[Lee, Tae Geol] ; 
  • Moon, DW[Moon, Dae Won]
  • 2014-03-20
  • Min, H[Min, Hyegeun]. (2014-03-20). A Method for Absolute Determination of the Surface Areal Density of Functional Groups in Organic Thin Films. doi: 10.5012/bkcs.2014.35.3.793
  • WILEY-V C H VERLAG GMBH
  • View : 908
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Article
Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS
  • Houssiau, L. ; 
  • Noel, C. ; 
  • Mine, N. ; 
  • Jung, K. W. ; 
  • Min, W. J. ; 
  • Moon, D. W.
  • 2014-11
  • Houssiau, L. (2014-11). Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS. doi: 10.1002/sia.5614
  • Wiley Blackwell
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Article
Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO 2 /SiO 2 /Si films
  • Min, Won Ja ; 
  • Marmitt, Gabriel ; 
  • Grande, Pedro L. ; 
  • Moon, DaeWon
  • 2019-07
  • Min, Won Ja. (2019-07). Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO 2 /SiO 2 /Si films. doi: 10.1002/sia.6642
  • John Wiley & Sons Inc.
  • View : 547
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