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Issue Date	Title Author(s) Journal	View
2021-02	Influence of post-annealing on structural, optical and electrical properties of tin nitride thin films prepared by atomic layer deposition Ansari, M.Z. ; Janicek, P. ; Nandi, D.K. ; Palka, K. ; Slang, S. ; Kim, D.H. ; Cheon, T. ; Kim, S.-H. Applied Surface Science, v.538, pp.147920, 2021-02	313
2019-11	Low-Temperature Atomic Layer Deposition of Highly Conformal Tin Nitride Thin Films for Energy Storage Devices Ansari, Mohd Zahid ; Nandi, Dip K. ; Janicek, Petr ; Ansari, Sajid Ali ; Ramesh, Rahul ; Cheon, Taehoon ; Shong, Bonggeun ; Kim, Soo-Hyun ACS Applied Materials & Interfaces, v.11, no.46, pp.43608 - 43621, 2019-11	553

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