Showing results 1 to 6 of 6
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Shin, Younghoon
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Yoo, Minsu
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Kim, Hyung-Sun
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Nam, Sung-Ki
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Kim, Hyoung-Ihl
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Lee, Sun-Kyu
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Kim, Sohee
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Kwon, Hyuk-Sang
- 2016-11
- Shin, Younghoon. (2016-11). Characterization of fiber-optic light delivery and light-induced temperature changes in a rodent brain for precise optogenetic neuromodulation. Biomedical Optics Express, 7(11), 4450–4471. doi: 10.1364/BOE.7.004450
- OSA - The Optical Society
- View : 899
- Download : 97
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Zhang, Hongshan
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Shi, Zhubing
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Banigan, Edward J.
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Kim, Yoori
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Yu, Hongtao
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Bai, Xiao-chen
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Finkelstein, Ilya J.
- 2023-08
- Zhang, Hongshan. (2023-08). CTCF and R-loops are boundaries of cohesin-mediated DNA looping. Molecular Cell, 83(16), 2856-2871.e8. doi: 10.1016/j.molcel.2023.07.006
- Cell Press
- View : 293
- Download : 0
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Kang, Joonhee
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Han, Byungchan
- 2016-07-21
- Kang, Joonhee. (2016-07-21). First-Principles Characterization of the Unknown Crystal Structure and Ionic Conductivity of Li7P2S8I as a Solid Electrolyte for High-Voltage Li Ion Batteries. Journal of Physical Chemistry Letters, 7(14), 2671–2675. doi: 10.1021/acs.jpclett.6b01050
- American Chemical Society
- View : 1067
- Download : 0
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Kim, Yeonghun
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Jin, Kangwoo
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Park, In-Hyeok
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Lee, Sanghyeop
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Park, Jinkyu
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Park, Jinhee
- 2024-03
- Kim, Yeonghun. (2024-03). Selective Sr2+ capture in an In3+-based anionic metal-organic framework. Chemical Engineering Journal, 484. doi: 10.1016/j.cej.2024.149321
- Elsevier
- View : 317
- Download : 0
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Kim, Yong Song
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Lee, Seonghun
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Ijaz, Umer Zeeshan
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Kim, Kyung Youn
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Choi, Bong Yeol
- 2007-07
- Kim, Yong Song. (2007-07). Sensitivity map generation in electrical capacitance tomography using mixed normalization models. Measurement Science and Technology, 18(7), 2092–2102. doi: 10.1088/0957-0233/18/7/040
- Institute of Physics and the Physical Society
- View : 227
- Download : 0
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Kim, Yong Song
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Lee, Seonghun
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Ijaz, Umer Zeeshan
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Kim, Kyung Youn
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Choi, Bong Yeol
- 2007-07
- Kim, Yong Song. (2007-07). Sensitivity map generation in electrical capacitance tomography using mixed normalization models. Measurement Science and Technology, 18(7), 2092–2102. doi: 10.1088/0957-0233/18/7/040
- Institute of Physics and the Physical Society
- View : 817
- Download : 0
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