Showing results 1 to 2 of 2
- 2011-11-10
- Jeong, J. (2011-11-10). Numerical analysis of effects of back channel interfacial states on characteristics of amorphous InGaZnO thin-film transistors. Electronics Letters, 47(23), 1295–1297. doi: 10.1049/el.2011.2024
- Institution of Engineering and Technology
- View : 139
- Download : 0
- 2011-11
- Jeong, Jae Wook. (2011-11). Numerical analysis of effects of back channel interfacial states on characteristics of amorphous InGaZnO thin-film transistors. Electronics Letters, 47(23), 1295–1297. doi: 10.1049/el.2011.2024
- Institute of Electrical Engineers
- View : 835
- Download : 0
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