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Article
Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement
- Kim, Dong Hwan ;
- Kim, Cham ;
- Kim, Jong Tae ;
- Yoon, Duck Ki ;
- Kim, Hoyoung
- 2018-12
- Kim, Dong Hwan. (2018-12). Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement. doi: 10.1016/j.measurement.2018.07.030
- Elsevier B.V.
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