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Issue Date	Title Author(s) Journal	View
2013-09-07	Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-Othin-film transistors using gated-four-probe measurements Jeong, Jaewook ; Lee, Gwang Jun ; Kim, Joonwoo ; Jeong, Soon Moon ; Kim, Jung-Hye Journal of Applied Physics, v.114, no.9, 2013-09-07	578
2018-04	High-performance and scalable metal-chalcogenide semiconductors and devices via chalco-gel routes Kwon, Sung Min ; Won, Jong Kook ; Jo, Jeong-Wan ; Kim, Jaehyun ; Kim, Hee-Joong ; Kwon, Hyuck-In ; Kim, Jaekyun ; Ahn, Sangdoo ; Kim, Yong-Hoon ; Lee, Myoung Jae ; et al Science Advances, v.4, no.4, 2018-04	588

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