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Article
Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-Othin-film transistors using gated-four-probe measurements
  • Jeong, Jaewook ; 
  • Lee, Gwang Jun ; 
  • Kim, Joonwoo ; 
  • Jeong, Soon Moon ; 
  • Kim, Jung-Hye
  • 2013-09-07
  • Jeong, Jaewook. (2013-09-07). Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-Othin-film transistors using gated-four-probe measurements. Journal of Applied Physics, 114(9). doi: 10.1063/1.4819886
  • American Institute of Physics Publishing
  • View : 724
  • Download : 0

High-performance and scalable metal-chalcogenide semiconductors and devices via chalco-gel routes

Article
High-performance and scalable metal-chalcogenide semiconductors and devices via chalco-gel routes
  • Kwon, Sung Min ; 
  • Won, Jong Kook ; 
  • Jo, Jeong-Wan ; 
  • Kim, Jaehyun ; 
  • Kim, Hee-Joong ; 
  • Kwon, Hyuck-In ; 
  • Kim, Jaekyun ; 
  • Ahn, Sangdoo ; 
  • Kim, Yong-Hoon ; 
  • Lee, Myoung Jae ; 
    • et al
  • 2018-04
  • Science Advances, v.4, no.4
  • American Association for the Advancement of Science
  • View : 816
  • Download : 81
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