Browsing by Titles

Showing results 1 to 6 of 6

  • 2019-06
  • Akter, Lata Ayesha. (2019-06). Double random phase encoding with a Poisson-multinomial distribution for efficient colorful image authentication. Multimedia Tools and Applications, 78(11), 14613–14632. doi: 10.1007/s11042-018-6844-1
  • Springer New York LLC
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  • Kim, You Hyun
  • Song, Jae Hun
  • Moon, In Kyu
  • Lee, Yeon Ho
  • 2018-08
  • Kim, You Hyun. (2018-08). Interference-based multiple-image encryption using binary phase masks. doi: 10.1016/j.optlaseng.2018.01.012
  • Elsevier BV
  • View : 939
  • Download : 0

Privacy-Preserving Image Captioning with Deep Learning and Double Random Phase Encoding

  • Martin, Antoinette Deborah
  • Ahmadzadeh, Ezat
  • Moon, Inkyu
  • 2022-08
  • Martin, Antoinette Deborah. (2022-08). Privacy-Preserving Image Captioning with Deep Learning and Double Random Phase Encoding. Mathematics, 10(16). doi: 10.3390/math10162859
  • MDPI AG
  • View : 374
  • Download : 29
  • Kim, Youhyun
  • Sim, Minwoo
  • Moon, Inkyu
  • Javidi, Bahram
  • 2019-12
  • Kim, Youhyun. (2019-12). Secure Random Phase Key Exchange Schemes for Image Cryptography. doi: 10.1109/JIOT.2019.2942048
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 831
  • Download : 0

Secure storage and retrieval schemes for multiple encrypted digital holograms with orthogonal phase encoding multiplexing

  • 2019-08
  • Kim, Youhyun. (2019-08). Secure storage and retrieval schemes for multiple encrypted digital holograms with orthogonal phase encoding multiplexing. Optics Express, 27(16), 22147–22160. doi: 10.1364/OE.27.022147
  • Optical Society of America
  • View : 688
  • Download : 151
  • Lee, Haeyun
  • Lee, Moon Hwan
  • Youn, Sangyeon
  • Lee, Kyungsu
  • Lew, Hah Min
  • Hwang, Jae Youn
  • 2022-09
  • Lee, Haeyun. (2022-09). Speckle Reduction via Deep Content-Aware Image Prior for Precise Breast Tumor Segmentation in an Ultrasound Image. IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 69(9), 2638–2650. doi: 10.1109/TUFFC.2022.3193640
  • Institute of Electrical and Electronics Engineers
  • View : 516
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