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Issue Date	Title Author(s) Journal	View
2022-03	A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding Yoon, Jong-Hyeok ; Chang, Muya ; Khwa, Win-San ; Chih, Yu-Der ; Chang, Meng-Fan ; Raychowdhury, Arijit IEEE Journal of Solid-State Circuits, v.57, no.3, pp.845 - 857, 2022-03	210

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