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Issue Date Title Author(s) Journal View
2019-09

Baik, Seunghun Kwon, Hyeokjin Paeng, Chuck Zhang, He Kalkofen, Bodo Jang, Jae Eun Kim, Y. S. Kwon, Hyuk-Jun

IEEE Electron Device Letters, v.40, no.9, pp.1507 - 1510, 2019-09

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