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Showing results 1 to 3 of 3

  • Yoon, Jong-Hyeok
  • Chang, Muya
  • Khwa, Win-San
  • Chih, Yu-Der
  • Chang, Meng-Fan
  • Raychowdhury, Arijit
  • 2022-03
  • Yoon, Jong-Hyeok. (2022-03). A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding. IEEE Journal of Solid-State Circuits, 57(3), 845–857. doi: 10.1109/JSSC.2022.3141370
  • Institute of Electrical and Electronics Engineers
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  • Yoon, Jong-Hyeok
  • Chang, Muya
  • Khwa, Win-San
  • Chih, Yu-Der
  • Chang, Meng-Fan
  • Raychowdhury, Arijit
  • 2022-01
  • Yoon, Jong-Hyeok. (2022-01). A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection. IEEE Journal of Solid-State Circuits, 57(1), 68–79. doi: 10.1109/jssc.2021.3101209
  • Institute of Electrical and Electronics Engineers
  • View : 504
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  • Jung, Sangwoo
  • Lee, Jaehyun
  • Park, Dahoon
  • Lee, Youngjoo
  • Yoon, Jong-Hyeok
  • Kung, Jaeha
  • 2024-12
  • Jung, Sangwoo. (2024-12). A Dual-Precision and Low-Power CNN Inference Engine Using a Heterogeneous Processing-in-Memory Architecture. IEEE Transactions on Circuits and Systems I: Regular Papers, 71(12), 5546–5559. doi: 10.1109/TCSI.2024.3395842
  • Institute of Electrical and Electronics Engineers
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