WEB OF SCIENCE
SCOPUS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Moon, DaeWon | - |
| dc.date.accessioned | 2019-12-18T08:36:54Z | - |
| dc.date.available | 2019-12-18T08:36:54Z | - |
| dc.date.created | 2019-12-18 | - |
| dc.date.issued | 2020-01 | - |
| dc.identifier.issn | 0142-2421 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/11019 | - |
| dc.description.abstract | In this perspective on recent advances in medium-energy ion scattering (MEIS), I focus on the current issues to make MEIS a practically powerful and useful analysis technique for nanostructured materials and devices after a brief summary of MEIS, thereby highlighting the need for an extensive review on the development of MEIS methodology and its application to a wide range of contexts. © 2019 John Wiley & Sons, Ltd. | - |
| dc.language | English | - |
| dc.publisher | John Wiley & Sons Inc. | - |
| dc.title | Recent advances in MEIS | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1002/sia.6708 | - |
| dc.identifier.wosid | 000499119300001 | - |
| dc.identifier.scopusid | 2-s2.0-85075918711 | - |
| dc.identifier.bibliographicCitation | Moon, DaeWon. (2020-01). Recent advances in MEIS. Surface and Interface Analysis, 52(1–2), 63–67. doi: 10.1002/sia.6708 | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.subject.keywordPlus | ENERGY-ION-SCATTERING | - |
| dc.subject.keywordPlus | GROWTH | - |
| dc.subject.keywordPlus | RESOLUTION | - |
| dc.subject.keywordPlus | STRAIN | - |
| dc.subject.keywordPlus | SURFACE | - |
| dc.subject.keywordPlus | FILMS | - |
| dc.citation.endPage | 67 | - |
| dc.citation.number | 1-2 | - |
| dc.citation.startPage | 63 | - |
| dc.citation.title | Surface and Interface Analysis | - |
| dc.citation.volume | 52 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
| dc.type.docType | Article | - |
