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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 임성준 | - |
| dc.contributor.author | 이현준 | - |
| dc.contributor.author | 김준우 | - |
| dc.contributor.author | 노희연 | - |
| dc.contributor.author | 김준서 | - |
| dc.date.accessioned | 2020-02-25T02:52:11Z | - |
| dc.date.available | 2020-02-25T02:52:11Z | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/11219 | - |
| dc.title | 국소 열처리를 통한 트랜지스터 특성 복원방법 | - |
| dc.title.alternative | REPAIRING METHOD OF CHARACTERISTICS OF TRANSISTORS BY LOCAL HEAT TREATMENT | - |
| dc.type | Patent | - |
| dc.publisher.country | CH | - |
| dc.identifier.patentApplicationNumber | 10711457.8 | - |
| dc.date.application | 2018-04-27 | - |
| dc.identifier.patentRegistrationNumber | I676214 | - |
| dc.date.registration | 2019-11-01 | - |
| dc.contributor.assignee | (재)대구경북과학기술원(100/100) | - |
| dc.type.iprs | 특허 | - |
