DGIST Scholar: 이현준

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이현준 (Lee, Hyeon-Jun)

ISNI Researcher ID ORCiD Scopus Google Scholar Research Gate

Department: Division of Nanotechnology

Affiliated Community: Division of Nanotechnology

Research Interests: 산화물반도체;IGZO;memristor;멤리스터;저항메모리;resistance memory;neuromorphic;device;degradation;hot electron;display device;gate driver;oxide semiconductor

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Issue Date	Title Author(s) Journal	View
2022-12	Thermoelectric performance of novel single-layer ZrTeSe4 Yun, Won Seok ; Lee, Hyeon-Jun ; Kim, June-Seo ; Lee, Myoung-Jae ; Han, Sang Wook Physical Chemistry Chemical Physics, v.24, no.46, pp.28250 - 28256, 2022-12	121
2022-11	Hydrogen diffusion and its electrical properties variation as a function of the IGZO stacking structure Noh, Hee Yeon ; Lee, Woo‑Geun ; G. R., Haripriya ; Cha, Jung‑Hwa ; Kim, June-Seo ; Yun, Won Seok ; Lee, Myoung-Jae ; Lee, Hyeon-Jun Scientific Reports, v.12, no.1, 2022-11	110
2022-07	Development of a Temperature Sensor Using Spin-Crossover Fe(pyrazine)[Pt(CN)(4)I] Nanoparticles Eom, Yunji ; Kim, Keonmok ; Lee, Hyeon-Jun ; Torati, Sri Ramulu ; Kim, CheolGi IEEE Magnetics Letters, v.13, 2022-07	148
2021-05	Parasitic Current Induced by Gate Overlap in Thin-Film Transistors Lee, Hyeon-Jun ; Katsumi Abe ; Kim, June-Seo ; Yun, Won Seok ; Lee, Myoung-Jae MDPI Open Access Publishing, 2021-05	272
2021-01	Non-equilibrium chiral domain wall dynamics excited by transverse magnetic field pulses Cho, Jaehun ; Kim, Kyoung-Whan ; Lee, Myoung-Jae ; Lee, Hyeon-Jun ; Kim, June-Seo Journal of Physics: Condensed Matter, v.33, no.1, 2021-01	397
2020-11	Measurement of Exciton and Trion Energies in Multistacked hBN/WS2 Coupled Quantum Wells for Resonant Tunneling Diodes Lee, Myoung-Jae ; Seo, David H. ; Kwon, Sung Min ; Kim, Dohun ; Kim, Youngwook ; Yun, Won Seok ; Cha, Jung-Hwa ; Song, Hyeon-Kyo ; Lee, Shinbuhm ; Jung, Minkyung ; et al American Chemical Society, 2020-11	571
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi Institute of Electrical and Electronics Engineers, 2020-06	399
2019-08	Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor Lee, Hyeon-Jun ; Abe, Katsumi ; Noh, Hee Yeon ; Kim, June-Seo ; Lee, Hyunki ; Lee, Myoung-Jae Nature Publishing Group, 2019-08	570
2019-01	Role of Hydrogen in Active Layer of Oxide-Semiconductor-Based Thin Film Transistors Noh, Hee Yeon ; Kim, Joonwoo ; Kim, June-Seo ; Lee, Myoung-Jae ; Lee, Hyeon-Jun Multidisciplinary Digital Publishing Institute (MDPI), 2019-01	546
2018-12	Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States Lee, Hyeon-Jun ; Abe, Katsumi ; Cho, Sung Haeng ; Kim, June Seo ; Bang, Seokhwan ; Lee, Myoung Jae Institute of Electrical and Electronics Engineers Inc., 2018-12	428
2018-08	Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode Song, Min Ho ; Lee, HyunKi ; Seo, David Hyungseok ; Lee, Hyeon-Jun ; Kim, June-Seo ; Cho, Hui-Sup ; Lyu, Hong-Kun ; Seo, Sun Ae ; Lee, Myoung-Jae Institute of Electrical and Electronics Engineers Inc., 2018-08	750
2018-07	Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis Lee, Myoung-Jae ; Park, Gyeong-Su ; Seo, David Hyungseok ; Kwon, Sung Min ; Lee, Hyeon-Jun ; Kim, June-Seo ; Jung, Minkyung ; You, Chun-Yeol ; Lee, Hyangsook ; Kim, Hee-Goo ; et al ACS Applied Materials & Interfaces, v.10, no.35, pp.29757 - 29765, 2018-07	684
2018-06	Field driven magnetic racetrack memory accompanied with the interfacial Dzyaloshinskii-Moriya interaction Kim, June Seo ; Lee, Hyeon-Jun ; Hong, Jung Il ; You, Chun Yeol Elsevier B.V., 2018-06	687
2017-12	Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor Lee, Hyeon-Jun ; Abe, Katsumi ; Kim, June-Seo ; Lee, Myoung Jae Nature Publishing Group, 2017-12	588
2017-08	Impact of transient currents caused by alternating drain stress in oxide semiconductors Lee, Hyeon-Jun ; Cho, Sung Haeng ; Abe, Katsumi ; Lee, Myoung-Jae ; Jung, Minkyung Nature Publishing Group, 2017-08	626

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