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국소 열처리를 통한 트랜지스터 특성 복원방법

Title
국소 열처리를 통한 트랜지스터 특성 복원방법
Translated Title
Repairing method of characteristics of transistors
Inventors
이현준; 임성준; 노희연; 김준우; 김준서; 최병대
DGIST Inventors
이현준; 임성준; 노희연; 김준우; 김준서; 최병대
Country
KO
Application Date
2017-04-27
Application No.
10-2017-0054241
Registration Date
2018-04-02
Registration No.
10-1846477
Assignee
(재)대구경북과학기술원(100/100)
URI
http://hdl.handle.net/20.500.11750/8957
https://doi.org/10.8080/1020170054241KIPRIS
Abstract
디스플레이 제품의 비정상 구동하는 소자의 특성 복원 기술 제안 디스플레이 구동부 및 회로부에 비정상적인 특성을 나타내는 소자나 ESD(정전기)등으로 인한 파괴된 소자를 레이저를 활용한 국소 열처리 진행으로 특성을 복원하는 방안 제안
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Collection:
Division of Nanotechnology3. Patents
Division of Electronics & Information System3. Patents
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