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Breaking the absorption limit of Si toward SWIR wavelength range via strain engineering
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Title
Breaking the absorption limit of Si toward SWIR wavelength range via strain engineering
DGIST Authors
Katiyar, Ajit K.Thai, Kean YouYun, Won SeokLee, JaeDongAhn, Jong-Hyun
Issued Date
2020-07
Citation
Katiyar, Ajit K. (2020-07). Breaking the absorption limit of Si toward SWIR wavelength range via strain engineering. doi: 10.1126/sciadv.abb0576
Type
Article
Article Type
Article
Keywords
SILICONBANDGAPPHOTODIODE
ISSN
2375-2548
Abstract
Silicon has been widely used in the microelectronics industry. However, its photonic applications are restricted to visible and partial near-infrared spectral range owing to its fundamental optical bandgap (1.12 eV). With recent advances in strain engineering, material properties, including optical bandgap, can be tailored considerably. This paper reports the strain-induced shrinkage in the Si bandgap, providing photosensing well beyond its fundamental absorption limit in Si nanomembrane (NM) photodetectors (PDs). The Si-NM PD pixels were mechanically stretched (biaxially) by a maximum strain of similar to 3.5% through pneumatic pressure-induced bulging, enhancing photoresponsivity and extending the Si absorption limit up to 1550 nm, which is the essential wavelength range of the lidar sensors for obstacle detection in self-driving vehicles. The development of deformable three-dimensional optoelectronics via gas pressure-induced bulging also facilitated the realization of unique device designs with concave and convex hemispherical architectures, which mimics the electronic prototypes of biological eyes.
URI
http://hdl.handle.net/20.500.11750/12537
DOI
10.1126/sciadv.abb0576
Publisher
American Association for the Advancement of Science
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이재동
Lee, JaeDong이재동

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