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A Broadband PVT-Insensitive All-nMOS Noise-Canceling Balun-LNA for Subgigahertz Wireless Communication Applications
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dc.contributor.author Kim, Dongmin -
dc.contributor.author Jang, Seunghyeok -
dc.contributor.author Lee, Junghyup -
dc.contributor.author Im, Donggu -
dc.date.accessioned 2021-01-22T07:20:11Z -
dc.date.available 2021-01-22T07:20:11Z -
dc.date.created 2021-01-14 -
dc.date.issued 2021-02 -
dc.identifier.issn 1531-1309 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/12722 -
dc.description.abstract A broadband process, voltage, and temperature (PVT)-insensitive noise-canceling balun-low-noise amplifier (LNA) was implemented in the 0.13-μm CMOS process for subgigahertz wireless communication applications. The proposed LNA is based on the traditional common-gate common-source (CGCS) balun-LNA topology, and it adopts the diode-connected loads to reduce the noise contribution originated from CGCS transistors and enhance the linearity due to post linearization. The auxiliary common-source (CS) amplifier with a diode-connected is added to reduce the overall noise figure (NF) of the LNA by sharing an input signal with CGCS transistors and applying its output signal to the diode-connected load of CS transistor. Because the voltage gain of the LNA is determined by the transconductance (gₘ) ratio of the same types of nMOS transistors, its power gain (S₂₁) and NF are quite roust over PVT variations. In experiments, it showed S₂₁ of 14 dB and NF of 4 dB with an input return loss (S₁₁) of greater than 10 dB at 450 MHz. Concerning voltage variation (1.08-1.32 V) and temperature variation (-20 °C ~ +80 °C), the worst variations in S₂₁ and NF were approximately 1.4 and 1.1 dB, respectively. IEEE -
dc.language English -
dc.publisher Institute of Electrical and Electronics Engineers -
dc.title A Broadband PVT-Insensitive All-nMOS Noise-Canceling Balun-LNA for Subgigahertz Wireless Communication Applications -
dc.type Article -
dc.identifier.doi 10.1109/LMWC.2020.3042233 -
dc.identifier.scopusid 2-s2.0-85098785018 -
dc.identifier.bibliographicCitation Kim, Dongmin. (2021-02). A Broadband PVT-Insensitive All-nMOS Noise-Canceling Balun-LNA for Subgigahertz Wireless Communication Applications. IEEE Microwave and Wireless Components Letters, 31(2), 165–168. doi: 10.1109/LMWC.2020.3042233 -
dc.description.isOpenAccess FALSE -
dc.subject.keywordAuthor common-gate (CG) -
dc.subject.keywordAuthor common-source (CS) -
dc.subject.keywordAuthor diode-connected load -
dc.subject.keywordAuthor low-noise amplifier (LNA) -
dc.subject.keywordAuthor noise-canceling -
dc.subject.keywordAuthor post linearization -
dc.subject.keywordAuthor process -
dc.subject.keywordAuthor voltage -
dc.subject.keywordAuthor and temperature (PVT) variations -
dc.subject.keywordAuthor subgigahertz -
dc.subject.keywordAuthor wideband -
dc.subject.keywordAuthor Noise measurement -
dc.subject.keywordAuthor Transistors -
dc.subject.keywordAuthor Gain -
dc.subject.keywordAuthor Wireless communication -
dc.subject.keywordAuthor Current measurement -
dc.subject.keywordAuthor MOSFET -
dc.subject.keywordAuthor Broadband communication -
dc.subject.keywordAuthor Balun -
dc.subject.keywordPlus Voltage variation -
dc.subject.keywordPlus Broadband amplifiers -
dc.subject.keywordPlus Diode amplifiers -
dc.subject.keywordPlus Diodes -
dc.subject.keywordPlus Noise figure -
dc.subject.keywordPlus Transistors -
dc.subject.keywordPlus Common gate common sources -
dc.subject.keywordPlus Input return loss -
dc.subject.keywordPlus NMOS transistors -
dc.subject.keywordPlus Noise canceling -
dc.subject.keywordPlus Noise contributions -
dc.subject.keywordPlus Temperature variation -
dc.subject.keywordPlus Wireless communication applications -
dc.subject.keywordPlus Low noise amplifiers -
dc.citation.endPage 168 -
dc.citation.number 2 -
dc.citation.startPage 165 -
dc.citation.title IEEE Microwave and Wireless Components Letters -
dc.citation.volume 31 -
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Department of Electrical Engineering and Computer Science

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