Deep Learning-Based Apple Defect Detection with Residual SqueezeNet
Issued Date
2020-07-08
Citation
Alam, M. D. Nur. (2020-07-08). Deep Learning-Based Apple Defect Detection with Residual SqueezeNet. International Conference on Smart Computing and Cyber Security: Strategic Foresight, Security Challenges and Innovation, SMARTCYBER 2020, 127–134. doi: 10.1007/978-981-15-7990-5_12