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dc.contributor.author Yoo, Woosuk -
dc.contributor.author Choo, Seongmin -
dc.contributor.author Jo, Sinyong -
dc.contributor.author You, Chun-Yeol -
dc.contributor.author Hong, Jung-Il -
dc.contributor.author Lee, Kyujoon -
dc.contributor.author Jung, Myung-Hwa -
dc.date.accessioned 2021-03-10T01:44:20Z -
dc.date.available 2021-03-10T01:44:20Z -
dc.date.created 2021-02-18 -
dc.date.issued 2021-02 -
dc.identifier.issn 2169-3536 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/12974 -
dc.description.abstract Exchange bias (EB) effect has been vigorously researched for many years due to its possible applications in information storage and spintronics, especially in spin valves for magnetic recording devices. Even though many models have been expounded to this day, they do not prove convincingly the origins of EB effect. We attempt to establish the azimuthal dependence of EB effect with respect to varying the composition of the antiferromagnet CoxNi1-xO and temperature. In this report, we deposited the bilayer thin films of Ni0.8Fe0.2/CoxNi1-xO with x varying from 0.4 to 0.8 by magnetron sputtering and studied the variation of exchange bias field and coercivity. The EB effect was investigated for various external parameters such as temperature, the composition of antiferromagnetic layer, and the direction of magnetic field. The comparison between the calculations and experimental data showed good consistency with the spin glass model, and we suggest the validity of spin glass model to understand the origin of exchange bias effect in the Ni0.8Fe0.2/CoxNi1-xO bilayers. -
dc.language English -
dc.publisher Institute of Electrical and Electronics Engineers Inc. -
dc.title The Azimuthal Dependence of Exchange Bias Effect and Its Analysis by Spin Glass Model in Ni0.8Fe0.2/CoxNi1-xO Bilayers -
dc.type Article -
dc.identifier.doi 10.1109/ACCESS.2021.3055521 -
dc.identifier.scopusid 2-s2.0-85100477890 -
dc.identifier.bibliographicCitation IEEE Access, v.9, pp.221315 - 21322 -
dc.description.isOpenAccess TRUE -
dc.subject.keywordAuthor Magnetic field measurement -
dc.subject.keywordAuthor Nickel -
dc.subject.keywordAuthor Temperature dependence -
dc.subject.keywordAuthor Magnetic hysteresis -
dc.subject.keywordAuthor Magnetic fields -
dc.subject.keywordAuthor Glass -
dc.subject.keywordAuthor Spintronics -
dc.subject.keywordAuthor antiferromagnetic materials -
dc.subject.keywordAuthor anisotropic magnetoresistance -
dc.subject.keywordAuthor Temperature measurement -
dc.subject.keywordPlus Digital storage -
dc.subject.keywordPlus Glass -
dc.subject.keywordPlus Magnetic storage -
dc.subject.keywordPlus Spin glass -
dc.subject.keywordPlus Antiferromagnetic layers -
dc.subject.keywordPlus Antiferromagnets -
dc.subject.keywordPlus Azimuthal dependence -
dc.subject.keywordPlus Bilayer thin films -
dc.subject.keywordPlus Exchange bias effects -
dc.subject.keywordPlus Exchange-bias fields -
dc.subject.keywordPlus Spin valve -
dc.subject.keywordPlus Spin-glass models -
dc.subject.keywordPlus Nickel compounds -
dc.citation.endPage 21322 -
dc.citation.startPage 221315 -
dc.citation.title IEEE Access -
dc.citation.volume 9 -

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