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Suppressing background noise in STED optical nanoscopy
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Title
Suppressing background noise in STED optical nanoscopy
Issued Date
2021-03
Citation
Jeong, Sejoo. (2021-03). Suppressing background noise in STED optical nanoscopy. Journal of the Korean Physical Society, 78(5), 401–407. doi: 10.1007/s40042-021-00057-7
Type
Article
Author Keywords
Super-resolution microscopySTEDBackground noise
Keywords
EMISSION DEPLETION MICROSCOPYSTIMULATED-EMISSIONRESOLUTIONSUBTRACTION
ISSN
0374-4884
Abstract
Super-resolution microscopy or optical nanoscopy has enabled all-optical observation of nanoscopic objects with resolution beyond Abbe’s diffraction limit. STimulated Emission Depletion (STED) nanoscopy achieves diffraction-unlimited resolution by employing a de-excitation laser with a hollow core in addition to the conventional excitation laser in confocal microscopy. One of the strong unexpected adverse effects in resolution improvement in STED nanoscopy is a structured, systematic background noise, which deteriorates the desired super-resolved image. Suppressing background noise, therefore, has been an important challenge in STED nanoscopy. Here, we introduce the characteristics of the background noise in STED nanoscopy and review several recent approaches that tackle this problem. The methods will be examined in comparison to one another and the advantages and disadvantages of each method will be highlighted. © 2021, The Korean Physical Society.
URI
http://hdl.handle.net/20.500.11750/12984
DOI
10.1007/s40042-021-00057-7
Publisher
한국물리학회
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