Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Manattayil, Jyothsna Konkada | - |
dc.contributor.author | Lal, Krishna A.S. | - |
dc.contributor.author | Biswas, Rabindra | - |
dc.contributor.author | Kim, Hyunmin | - |
dc.contributor.author | Raghunathan, Varun | - |
dc.date.accessioned | 2022-11-16T17:10:13Z | - |
dc.date.available | 2022-11-16T17:10:13Z | - |
dc.date.created | 2022-07-18 | - |
dc.date.issued | 2022-07 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11750/17144 | - |
dc.description.abstract | We experimentally demonstrate sub-diffraction imaging in infrared-sensitive third-order sum frequency generation (TSFG) microscope using focal-field engineering technique. The TSFG interaction studied here makes use of two mid infrared photons and a single 1040 nm pump photon to generate up-converted visible photons. Focal field engineering scheme is implemented using a Toraldo-style single annular phase mask imprinted on the 1040 nm beam using a spatial light modulator. The effect of focal field engineered excitation beam on the non-resonant-TSFG process is studied by imaging isolated silicon sub-micron disks and periodic grating structures. Maximum reduction in the measured TSFG central-lobe size by ∼43% with energy in the central lobe of 35% is observed in the presence of phase mask. Maximum contrast improvement of 30% is observed for periodic grating structures. Furthermore, to validate the infrared sensitivity of the focus engineered TSFG microscope, we demonstrate imaging of amorphous Germanium-based guided-mode resonance structures, and polystyrene latex beads probed near the O-H vibrational region. We also demonstrate the utility of the focus engineered TSFG microscope for high resolution imaging of two-dimensional layered material. Focus-engineered TSFG process is a promising imaging modality that combines infrared selectivity with improved resolution and contrast, making it suitable for nanostructure and surface layer imaging. © 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement | - |
dc.language | English | - |
dc.publisher | Optical Society of America | - |
dc.title | Focus-engineered sub-diffraction imaging in infrared-sensitive third-order sum frequency generation microscope | - |
dc.type | Article | - |
dc.identifier.doi | 10.1364/OE.459620 | - |
dc.identifier.scopusid | 2-s2.0-85133252407 | - |
dc.identifier.bibliographicCitation | Optics Express, v.30, no.14, pp.25612 - 25626 | - |
dc.description.isOpenAccess | FALSE | - |
dc.subject.keywordPlus | RAMAN SCATTERING MICROSCOPY | - |
dc.subject.keywordPlus | 2ND-HARMONIC GENERATION | - |
dc.subject.keywordPlus | 3RD-HARMONIC GENERATION | - |
dc.subject.keywordPlus | RESOLUTION | - |
dc.citation.endPage | 25626 | - |
dc.citation.number | 14 | - |
dc.citation.startPage | 25612 | - |
dc.citation.title | Optics Express | - |
dc.citation.volume | 30 | - |